Syllabus

V. Fidelity of Images

1. Linear System Analysis
1. Linear system properties
1. Linearity
2. Invariance
3. Isotropy
2. Spatial Convolution
3. Fourier analysis
1. Forward transform
2. Inverse transform
3. 2D transforms
4. Discrete transforms
5. Theorems
1. Convolution
2. Parseval's (Rayleighs)
3. Autocorrelation
4. Central Slice
5. Sampling
2. Resolution
1. Spatial Spread Functions
1. Point spread function
1. 2D response function
2. 1D function (isotropic)
3. FWHM, FWTM
2. Line spread function
1. Response to line source
2. projection of point source
3. isotropic PSF
3. Edge spread function
1. integral of half surface
2. LSF = derivative of PSF
2. Spatial frequency functions
1. Modulation Transfer Function
1. Output/input modulation
2. Normalized Fourier transform magnitude
2. Relation between MTF and PSF/LSF
1. Convolution theorem and image blur
2. 2D Fourier Transform of PSF
3. 1D Fourier Transform of LSF
4. Central Ordinate theorem
3. Experimental Measurement
1. Edge phantom
1. Materials
2. Fabrication
2. Image analysis
1. Angle determination
2. Sub-pixel reprojection
3. Edge differentiation
4. Fourier transform
3. Experimental Results
1. CR systems
2. Direct and Indirect DR systems
3. Noise
1. Spatial properties
1. Uncorrelated noise and variance
2. Correlated noise
3. Noise texture
2. Noise Power Spectrum
1. For uncorrelated noise
2. For correlated noise
3. Units, 1/mm2, and NEQ
4. DC value, large area quantum noise
3. Experimental Measurement
1. Uniform Exposure
1. Standard techniques (IEC)
2. Receptor input exposure
2. Image analysis
1. 2D FFT Power
2. Block Average
3. 1D description
3. Experimental Results
1. CR systems
2. Direct DR systems
4. Normalized NPS
1. NPS for an ideal detector
2. NEQ per mR
3. NEQ*NPS or (NEQ/mR)(NPS*mR)
4. Detective Quantum Efficiency
1. Frequency dependent SNR
2. DQE = (SNR_meas/SNR_ideal)^2
3. Experimental examples, CR & DR
4. Diagnostic value