Optoelectronic Components and Materials Group

Thickness Measurement

Woollam VASE ellipsometer can accurately measure the thickness of dielectric films. It can also take angle resolved spectroscopic measurements of films.

Facilities

• Analysis & Spectroscopy

  • Lasers & Optics
  • Spectrometers
  • Surface Science

• Device Testing

  • OLED Testing
  • PV and Photodetector testing

• Microscopy & Metrology

  • AFM
  • Film Thickness
  • Optical Microscopy

• Thin Film Growth

  • Atomic Layer Deposition
  • Crystalline Organic Film Fabrication and Analysis
  • Molecular Beam Epitaxy
  • OLED Fabrication
  • Organic Film Patterning
  • Organic PV and Photodetector